DFT's main target is to achieve maximum controllability and observability which helps to improve the yield and reliability of design. IDT helps improve the CVY and also the reliability of the design.

Belgium's Q-Star Test has announced the transient current monitor module QT-1411 for use as an add on to any ATE to perform IDDQ tests in production. The single-in-line module performs as a ...

Silicon providers are using adaptive test flows to reduce burn-in costs, one of the many approaches aimed at stemming cost increases at advanced nodes and in advanced packages. No one likes it when ...

Peter Maxwell, Research and Development Specialist, Semiconductor Products Group, Agilent Technologies Inc., Santa Clara, Calif., Pete O'Neil, Senior Technology ...